JPH0340749U - - Google Patents
Info
- Publication number
- JPH0340749U JPH0340749U JP10248389U JP10248389U JPH0340749U JP H0340749 U JPH0340749 U JP H0340749U JP 10248389 U JP10248389 U JP 10248389U JP 10248389 U JP10248389 U JP 10248389U JP H0340749 U JPH0340749 U JP H0340749U
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- skimmer
- mass spectrometer
- plasma
- frequency induction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000006698 induction Effects 0.000 claims description 4
- 238000009616 inductively coupled plasma Methods 0.000 claims description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 2
- 238000007747 plating Methods 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10248389U JPH0638372Y2 (ja) | 1989-08-31 | 1989-08-31 | 高周波誘導結合プラズマ質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10248389U JPH0638372Y2 (ja) | 1989-08-31 | 1989-08-31 | 高周波誘導結合プラズマ質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0340749U true JPH0340749U (en]) | 1991-04-18 |
JPH0638372Y2 JPH0638372Y2 (ja) | 1994-10-05 |
Family
ID=31651378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10248389U Expired - Lifetime JPH0638372Y2 (ja) | 1989-08-31 | 1989-08-31 | 高周波誘導結合プラズマ質量分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0638372Y2 (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200469616Y1 (ko) * | 2012-05-09 | 2013-10-25 | 이혁 | 롤 테이프 커터기의 테이프 휠 및 이를 적용한 롤 테이프 커터기 |
-
1989
- 1989-08-31 JP JP10248389U patent/JPH0638372Y2/ja not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200469616Y1 (ko) * | 2012-05-09 | 2013-10-25 | 이혁 | 롤 테이프 커터기의 테이프 휠 및 이를 적용한 롤 테이프 커터기 |
Also Published As
Publication number | Publication date |
---|---|
JPH0638372Y2 (ja) | 1994-10-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE125042T1 (de) | Vorrichtung zur feststellung von teilchen in flüssigen metallen. | |
JPH0340749U (en]) | ||
JPH0340748U (en]) | ||
JPH03100353U (en]) | ||
JPS6258855U (en]) | ||
JPH0316656U (en]) | ||
JPH0366146U (en]) | ||
JPH0366147U (en]) | ||
JPS6356557U (en]) | ||
JPS6420670U (en]) | ||
JPS6423868U (en]) | ||
JP2982189B2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
REZAAIYAAN et al. | Design and construction of a low-flow, low-power torch for inductively coupled plasma spectrometry[Interim Technical Report] | |
JPH0282030U (en]) | ||
JPS6455554U (en]) | ||
JPH0345633U (en]) | ||
JPS6273249U (en]) | ||
JPH0236152U (en]) | ||
JPS6420669U (en]) | ||
JPH0615392Y2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
JPS63123096U (en]) | ||
JPS62208535A (ja) | 高周波誘導結合プラズマ・質量分析装置 | |
JPS62177850A (ja) | 誘導結合プラズマ・質量分析計 | |
JPH0237445U (en]) | ||
JPS62184755A (ja) | 高周波誘導結合プラズマ質量分析装置 |